Lehigh University

•  Baird Home
•  Research
•  Courses
•  Students
•  Prof'l Activities
•  Conferences
•  Publications
•  Talks
•  Patents
•  Awards
•  Miscellaneous
•  Vita (PDF)


Henry S. Baird    Fall 2008 Course

Pattern Recognition     CSE 326/426

CRNs:  43875 (326); 43876 (426)

Note to CSE PhD Graduate Students:  this course fulfills two 'Core Areas':  (1) Computer Applications, and (2) Theory.

Note to undergraduates:  you are very welcome in this course; you'll do the same programming exercises as the grad students, but shorter HWs and exams.

An introduction to the state of the art of pattern recognition and document image processing, and the machine-learning theory, algorithms, and systems architectures that underlie them.

Theoretical topics will include Bayesian decision theory, statistically trainable vector-space classifiers, feature selection, parametric classifiers (for, e.g., likelihoods with Gaussian PDFs), non-parametric classifiers (e.g. nearest neighbors), Perceptrons, generalized linear discriminants, kernel-based methods, decision trees, SVMs, Neural Nets, ensemble classifiers, and randomized classifiers. Also, we study general methodological issues, including best practices for statistical training and testing, and the curse of dimensionality.
The last 1/3 of the course focuses on engineering challenges and applications chosen from the document image understanding R&D literature. These concretely illustrate state-of-the-art approaches to segmentation, contextual analysis (including syntax and semantics), autonomous adaptation, style-conscious recognition, and anytime algorithms.
Weekly written homeworks or short programming exercises.  A midterm exam.  Students will select a set of related research papers (or a dissertation) from the recent literature and present a short talk in class summarizing and critiquing them.  There is a choice between (1) a final exam or (2) a software project on a cutting-edge research problem from digital libraries or Web security (e.g. CAPTCHAs: vision-based Turing tests to tell computers and humans apart).

Course objective

On completing this course, students will be sufficiently familiar with the theory, notation, and vocabulary of pattern recognition and machine learning to be able to pursue matters of interest in the current technical literature. They will also have a grasp of key engineering issues arising in applications.

Further, this course serves as an introduction to the state of the art of  Document Image Analysis which is an essential technology in digital libraries, web-based search of scholarly materials, intelligence analysis, office automation, and web-based security.  These topics are being actively researched in Lehigh's Pattern Recognition Research laboratory.

Textbook: Pattern Classification (2nd Ed.), R. O. Duda, P. E. Hart, & D. G. Stork, John Wiley & Sons, October 2000. 680 pages. ISBN 0-471-05669-3.

Lectures:  Tuesdays & Thursdays, 9:20-10:35, Packard Lab 258. First meeting:  Tuesday, August 26.   (Last:  Thursday, Dec. 4.)

Instructor:  Prof. Henry Baird, hsb2@lehigh.edu; office:  Packard Lab 514C.   Office Hours:  Tuesdays 11-12 or by appointment.


CSE 340:  Algorithms -- or comparable background in basic algorithms and data structures.

Math 205: Linear Algebra etc -- or similar familiarity with linear algebra & matrices.

Math 231 or Math 309 or CSC 450: Applied Probability & Statistics -- or some background in discrete probability and applied statistics & data analysis.

CSE 109: Programming in C++ -- or enough experience with C++, Java, C, or MatLab to complete a small software project without faculty supervision.

Accommodations for Students with Disabilities:  If you have a disability for which you are or may be requesting accommodations, please contact both your instructor and the Office of Academic Support Services, University Center 212 (610-758-4152) as early as possible in the semester.  You must have documentation from the Academic Support Services office before accommodations can be granted.

If you have any questions about prerequisites, ask the instructor: hsb2@lehigh.edu.


© 2003 P.C. Rossin College of Engineering & Applied Science
Computer Science & Engineering, Packard Laboratory, Lehigh University, Bethlehem PA 18015