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Henry S. Baird Selected Invited Talks Keynote talk: "Towards Highly Versatile Document Image Analysis," at the 2nd Korea-Japan Pattern Recognition Workshop, Matsushima, Japan, October, 2007 [to appear]. Keynote Conference Address: "Digital Libraries and Document Image Analysis," at the 7th IAPR Int'l Conf. on Document Analysis and Recognition, Edinburgh, Scotland, August 4, 2003. [PPT] Invited Talk: "Image Understanding and Web Security," at the 1st IEEE Workshop on Document Image Analysis and Retrieval, Madison, WI, June 21, 2003. [PPT] Keynote Address: "Document Image Degradation Modeling," at the 4th IAPR Int'l Workshop on Document Analysis Systems, Rio de Janeiro, Brazil, 2000. Plenary Talk: "Document Image Analysis Research," at the IEEE Int'l Conf. on Computer Vision and Pattern Recognition, Fort Collins, CO 1999. Invited Talk: "Quantitative Evaluation Methodologies in Computer Vision," at the IEEE Workshop on Emprical Evaluation Methods in Computer Vision, Santa Barbara, CA, 1998. Keynote Technology Speech: at the USPS Advanced Technology Conference, Washington, DC, 1990. Invited Tutorial Talk: "Design Rule Checking Techniques," at the IEEE CANDE Workshop, Long Branch, NJ, 1977. |
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